16Mb: 1 Meg x 16 Async/Page/Burst CellularRAM 1.0 Memory
Electrical Characteristics
Table 10:
Deep Power-Down Specifications
Description
Deep power-down
Conditions
V IN = V CC Q or 0V; +25°C
Symbol
I ZZ
Typ
10
Units
μA
Table 11:
Capacitance
Description
Input capacitance
Input/output capacitance (DQ)
Conditions
T C = +25oC; f = 1 MHz;
V IN = 0V
Symbol
C IN
C IO
Min
2.0
3.0
Max
6.5
6.5
Units
pF
pF
Notes
1
1
Notes:
1. These parameters are verified in device characterization and are not 100 percent tested.
Figure 24:
AC Input/Output Reference Waveform
V CC Q
V CC /2
V CC Q/2
Input
1
2
Test Points
3
Output
V SS Q
Notes:
1. AC test inputs are driven at V CC Q for a logic 1 and V SS Q for a logic 0. Input rise and fall
times (10% to 90%) < 1.6ns.
2. Input timing begins at V CC /2. Due to the possibility of a difference between V CC and V CC Q,
the input test point may not be shown to scale.
3. Output timing ends at V CC Q/2.
Figure 25:
Output Load Circuit
Test Point
DUT
50
30pF
VccQ/2
Notes:
1. All tests are performed with the outputs configured for full drive strength (BCR[5] = 0b).
PDF: 09005aef81cb58ed/Source: 09005aef81c7a667
16mb_burst_cr1_0_p23z_2.fm - Rev. H 4/08 EN
32
Micron Technology, Inc., reserves the right to change products or specifications without notice.
?2005 Micron Technology, Inc. All rights reserved.
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